MYOUNGWON OH1, HANUL SUNG1, SANGGEOL LEE2,
HYEONSANG EOM1 AND HEON Y. YEOM1
1Department of Computer Science and Engineering
Seoul National University
Seoul, 151-742 Republic of Korea
2Semiconductor Department
Memory Application Engineering Group
Samsung Electronics, 443-743 Republic of Korea
E-mail: mwoh@dcslab.snu.ac.kr; husung@dcslab.snu.ac.kr;
aiden.lee@samsung.com; hseom@cse.snu.ac.kr