Hsiang-Cheh Huang, Shu-Chuan Chu*, Jeng-Shyang Pan**
and Zhe-Ming Lu*** Department of Electronics Engineering
National Chiao Tung University
Hsinchu, 300 Taiwan
*School of Informatics and Engineering
Flinders University of South Australia
Australia
**Department of Electronic Engineering
National Kaohsiung Institute of Technology
Kaohsiung, 807 Taiwan
E-mail: jspan@cc.nkit.edu.tw
***Department of Automatic Test and Control
Harbin Institute of Technology
Harbin, China